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Volumn 19, Issue 4, 1997, Pages 264-268
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A fast and versatile scan unit for scanning probe microscopy
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Author keywords
Piezo; Rapid scan unit; Scan speed; Scanning probe microscopy
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Indexed keywords
ARTICLE;
FEEDBACK SYSTEM;
MICROSCOPY;
PRIORITY JOURNAL;
SCANNING PROBE MICROSCOPY;
SCANNING TUNNELING MICROSCOPY;
SPECTROSCOPY;
TOPOGRAPHY;
YOUNG MODULUS;
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EID: 0031396454
PISSN: 01610457
EISSN: None
Source Type: Journal
DOI: 10.1002/sca.4950190403 Document Type: Article |
Times cited : (20)
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References (6)
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