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Journal of Applied Physics

Volumn 89, Issue 11 II, 2001, Pages 7517-7521

Atom probe analysis of roughness and chemical intermixing in CoFe/Cu films (invited)

(7) Larson, D J a Cerezo, A b Clifton, P H c Petford Long, A K b Martens, R L d Kelly, T F d Tabat, N a

a SEAGATE TECHNOLOGY (United States)

b UNIVERSITY OF OXFORD (United Kingdom)

c SEAGATE TECHNOLOGY (United Kingdom)

d Imago Scientific Instruments (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035356656 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.1354593 Document Type: Article

Times cited : (28)

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