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Volumn 95, Issue , 2003, Pages 223-229
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A new step towards the lattice reconstruction in 3DAP
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Author keywords
Field ion microscopy; Fourier analysis; Image reconstruction; Three dimensional atom probe
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Indexed keywords
CRYSTALLOGRAPHY;
FOURIER TRANSFORMS;
IMAGE ANALYSIS;
IMAGE RECONSTRUCTION;
IONIZATION;
OPTICAL RESOLVING POWER;
TUNGSTEN;
FIELD EVAPORATION;
CRYSTAL LATTICES;
TUNGSTEN;
ANALYTIC METHOD;
ARTICLE;
CRYSTALLOGRAPHY;
EVAPORATION;
FOURIER TRANSFORMATION;
IMAGE ANALYSIS;
IMAGE RECONSTRUCTION;
IONIZATION;
MODEL;
PREDICTION;
RELIABILITY;
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EID: 0037402101
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/S0304-3991(02)00320-0 Document Type: Article |
Times cited : (62)
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References (15)
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