Early SEU fault injection in digital, analog and mixed signal circuits: A global flow

Proceedings - Design, Automation and Test in Europe Conference and Exhibition

Volumn 1, Issue , 2004, Pages 590-595

  Leveugle, R ^a   Ammari, A ^a  

^a TIMA LABORATORY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG AND MIXED SIGNAL (AML) CIRCUITS; ANALOG BLOCKS; DESIGN FLOW; FAULT INJECTION TECHNIQUES; ANALOG AND MIXED SIGNAL CIRCUITS; FAULT INJECTION; HIGH-LEVEL MODELING; MIXED-SIGNAL CIRCUITS; PARAMETRIC VARIATION; TRANSIENT FAULTS; UNIFIED APPROACH;

ANALOG TO DIGITAL CONVERSION; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; INTEGRATED CIRCUIT LAYOUT; ITERATIVE METHODS; MATHEMATICAL MODELS; MOBILE COMPUTING; MOBILE TELECOMMUNICATION SYSTEMS; ONLINE SYSTEMS; PARAMETER ESTIMATION; PROBABILITY DISTRIBUTIONS; REAL TIME SYSTEMS; TRANSIENTS; ELECTRIC SIGNAL SYSTEMS; EXHIBITIONS; FAULT TREE ANALYSIS; INTEGRATED CIRCUITS;

DIGITAL CIRCUITS; FAULT DETECTION;

EID: 3042569040     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2004.1268909     Document Type: Conference Paper

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