Behavioural modelling of operational amplifier faults using VHDL-AMS

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2002, Pages 1133-

  Wilson, Peter R ^a   Kiliç, Yavuz ^b   Ross, J Neil ^a   Zwolinski, Mark ^a   Brown, Andrew D ^a  

^a UNIVERSITY OF SOUTHAMPTON   (United Kingdom)

^b NXP SEMICONDUCTORS   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

BEHAVIOURAL MODELLING; FAULT CONDITIONS; HDL MODELS; HIGH-LEVEL FAULT; LEVEL MODEL; MACRO MODEL; VHDL-AMS;

COMPUTER HARDWARE DESCRIPTION LANGUAGES; EXHIBITIONS;

OPERATIONAL AMPLIFIERS;

EID: 3042544030     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2002.998491     Document Type: Conference Paper

References (12)

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9. IEEE Standard 1076.1 (VHDL-AMS)
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11. Chang, Lee, Chen, & SU, "A Behaviour Level Fault Model for the Closed-Loop Operational Amplifier", Journal of Information Science and Engineering, 2000, 16, pp751-766
12. Wilson, Kilic, Ross, Zwolinski & Brown, "Behavioural Modeling of Operational amplfier Faults using analogue Hardware Description Languages (HDLs)", BMAS 2001