TLP calibration, correlation, standards, and new techniques

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn 24, Issue 2, 2000, Pages 85-96

  Barth, Jon E ^a   Verhaege, Koen ^b   Henry, Leo G ^c   Richner, John ^a  

^a Barth Electronics Inc   (United States)

^b SARNOFF CORPORATION   (United States)

^c ESD/TLP Consulting   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION DETECTORS; ELECTRIC ATTENUATORS; ELECTRIC DISCHARGES; ELECTRIC IMPEDANCE; ELECTRIC SWITCHES; ELECTROSTATICS; LEAKAGE CURRENTS; THROUGHPUT;

DEVICE UNDER TEST; ELECTROSTATIC DISCHARGE; TRANSMISSION LINE PULSE;

ELECTRIC LINES;

EID: 0034538752     PISSN: 07395159     EISSN: None     Source Type: Journal    
DOI: 10.1109/6104.930960     Document Type: Article

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