Field electron emission from undoped, continuous, submicron-thick diamond films

Journal of Applied Physics

Volumn 98, Issue 12, 2005, Pages

  Ternyak, O ^a   Akhvlediani, R ^a   Hoffman, A ^a   Wong, W K ^b   Lee, S T ^b   Lifshitz, Y ^a   Daren, S ^c   Cheifetz, E ^c  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^b CITY UNIVERSITY OF HONG KONG   (Hong Kong)

^c El Mul Technologies Ltd   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

FIELD ELECTRON EMISSION (FEE); MORPHOLOGICAL STABILITY; NUCLEATION DENSITIES; TURN-ON FIELD VALUES;

CURRENT DENSITY; ELECTRON EMISSION; NUCLEATION; POLYCRYSTALLINE MATERIALS; STRUCTURAL ANALYSIS; THICK FILMS; THICKNESS MEASUREMENT;

DIAMOND FILMS;

EID: 29744465520     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2149490     Document Type: Review

References (41)

1. W. Zhu, G. P. Kochanski, S. Jin, and L. Seibles, J. Appl. Phys. 78, 2707 (1995).
2. J. Y. Shim, H. K. Baik, and K. M. Song, J. Appl. Phys. 87, 7508 (2000).
3. M. W. Geis, J. C. Twichell, and T. M. Lyszczarz, J. Vac. Sci. Technol. B 14, 2060 (1996).
4. A. V. Karabutov, V. D. Frolov, S. M. Pimenov, and V. I. Konov, Diamond Relat. Mater. 8, 763 (1999).
5. O. Gröning, O. M. Küttel, P. Gröning, and L. Schlapbach, Appl. Surf. Sci. 111, 135 (1997).
6. O. S. Panwar, S. Kumar, S. S. Rajput, R. Sharma, and R. Bhattacharyya, Vacuum 72, 183 (2004).
7. H. Kiyota et al., Appl. Phys. Lett. 75, 2331 (1999).
8. B. S. Satyanarayana, A. Hart, W. I. Milne, and J. Robertson, Appl. Phys. Lett. 71, 1431 (1997).
9. X. Ding, Y. J. Li, Z. Sun, B. K. Tay, S. P. Lau, G. Y. Chen, W. Y. Cheung, and S. P. Wong, J. Appl. Phys. 88, 6842 (2000).
10. S. S. Fan, M. G. Chapline, N. R. Franklin, T. W. Tombler, A. M. Cassell, and H. J. Dai, Science 283, 512 (1999).
11. A. M. Rao, D. Jacques, R. C. Haddon, W. Zhu, C. Bower, and S. Jin, Appl. Phys. Lett. 76, 3813 (2000).
12. H. Murakami, M. Hirakawa, C. Tanaka, and H. Yamakawa, Appl. Phys. Lett. 76, 1776 (2000).
13. S. Gupta, B. L. Weiss, B. R. Weiner, and G. Morell, J. Appl. Phys. 89, 5671 (2001).
14. J. B. Cui, J. Robertson, and W. I. Milne, J. Appl. Phys. 89, 5707 (2001).
15. W. Zhu, G. P. Kochanski, and S. Jin, Science 282, 1471 (1998).
16. A. Göhl, B. Günther, T. Habermann, G. Müller, M. Schrej, K. H. Thürer, and B. Strizker, J. Vac. Sci. Technol. B 18, 1031 (2000).
17. N. A. Fox, W. N. Wang, T. J. Davis, J. W. Steeds, and P. W. May, Appl. Phys. Lett. 71, 2337 (1997).
18. P. W. May, S. Höhn, M. N. R. Ashfold, W. N. Wang, N. A. Fox, T. J. Davis, and J. W. Steds, J. Appl. Phys. 84, 1618 (1998).
19. O. Gröning, L.-O. Nilsson, P. Gröning, and L. Schlapbach, Solid-State Electron. 45, 929 (2001).
20. J. B. Cui, M. Stammler, J. Ristein, and L. Ley, J. Appl. Phys. 88, 3667 (2000).
21. K. H. Park et al., J. Vac. Sci. Technol. B 16, 724 (1998).
22. J. J. Liu, D. Y. T. Chiu, D. C. Morton, D. H. Kang, V. V. Zhirnov, J. J. Hren, and J. J. Cuomo, Solid-State Electron. 45, 915 (2001).
23. X. L. Peng, Thin Solid Films 370, 63 (2000).
24. I. T. Han, N. Lee, S. W. Lee, S. H. Kim, and D. Jeon, J. Vac. Sci. Technol. B 16, 2052 (1998).
25. K. Okano, S. Koizumi, S. R. P. Silva, and G. A. J. Amaratunga, Nature (London) 381, 140 (1996).
26. A. R. Krauss et al., J. Appl. Phys. 89, 2958 (2001).
27. S. R. P. Silva and R. G. Forbes, Ultramicroscopy 73, 51 (1998).
28. P. Lerner, N. M. Miskovsky, and P. H. Culter, J. Vac. Sci. Technol. B 16, 900 (1998).
29. R. Schlesser, M. T. McClure, B. L. McCarson, and Z. Sitar, Diamond Relat. Mater. 7, 636 (1998).
30. V. V. Zhirnov, J. Liu, G. J. Wojak, J. J. Cuomo, and J. J. Hren, J. Vac. Sci. Technol. B 16, 1188 (1998).
31. V. V. Zhirnov, W. B. Choi, J. J. Cuomo, and J. J. Hren, Appl. Surf. Sci. 94/95, 123 (1996).
32. T. Toyama, Y. Koide, and M. Murakami, Diamond Relat. Mater. 11, 1897 (2002).
33. C. Gu, Z. Jin, Y. Wang, W. Jin, H. Ji, G. Yuan, and W. Wang, Diamond Relat. Mater. 9, 1604 (2000).
34. H. Ji et al., J. Vac. Sci. Technol. B 18, 2710 (2000).
35. R. Akhvlediani, I. Lior, Sh. Michaelson, and A. Hoffman, Diamond Relat. Mater. 11, 545 (2002).
36. A. C. Ferrari and J. Robertson, Phys. Rev. B 63, 121405 (R) (2001).
37. R. Pfeiffer, H. Kuzmany, P. Knoll, S. Bokova, N. Salk, and B. Gunther, Diamond Relat. Mater. 12, 268 (2003).
38. K. M. Song, J. Y. Shim, and H. K. Baik, Diamond Relat. Mater. 11, 185 (2002).
39. N. S. Xu, Ultramicroscopy 79, 59 (1999).
40. F. Lacher, C. Wild, D. Behr, and P. Koidl, Diamond Relat. Mater. 6, 1111 (1997).
41. O. Ternyak, A. Cimmino, S. Prawer, and A. Hoffman, Diamond Relat. Mater. 14, 272 (2005).