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Volumn 111, Issue , 1997, Pages 135-139

Field emission from DLC films

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONDUCTIVE FILMS; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRON EMISSION; ELECTRON ENERGY LEVELS; INCLUSIONS; SCANNING TUNNELING MICROSCOPY; SURFACE STRUCTURE;

EID: 0031550402     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(96)00713-1     Document Type: Article
Times cited : (104)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.