Electron diffraction analysis of individual single-walled carbon nanotubes

Ultramicroscopy

Volumn 106, Issue 3, 2006, Pages 176-190

  Meyer, Jannik C ^a   Paillet, Matthieu ^b   Duesberg, Georg S ^c   Roth, Siegmar ^a  

^a MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

^b UNIVERSITÉ MONTPELLIER 2   (France)

^c INFINEON TECHNOLOGIES AG   (Germany)

Author keywords

Carbon nanotubes; Electron diffraction; Nanotube and TEM sample preparation

Indexed keywords

CARBON NANOTUBES; COMPUTER SIMULATION; TEMPERATURE DISTRIBUTION; THERMAL EFFECTS; TRANSMISSION ELECTRON MICROSCOPY;

SINGLE-SHELL NANOTUBES; TEM SAMPLE PREPARATION;

ELECTRON DIFFRACTION;

CARBON NANOTUBE; NANOPARTICLE;

ACCURACY; DIFFRACTION; ELECTRON DIFFRACTION; REVIEW; SIMULATION; TRANSMISSION ELECTRON MICROSCOPY;

EID: 29244464376     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2005.07.008     Document Type: Article

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