Electron diffraction and microscopy of single-wall carbon nanotube bundles produced by different methods

European Physical Journal B

Volumn 27, Issue 1, 2002, Pages 111-118

  Colomer, J F ^a   Henrard, L ^b   Lambin, Ph ^b   Van Tendeloo, G ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b UNIVERSITY OF NAMUR   (Belgium)

Author keywords

61.14. x Electron diffraction and scattering; 61.48.+c Fullerenes and fullerene related materials; 68.37.Lp Transmission electron microscopy (TEM) (including STEM, HRTEM, etc.)

Indexed keywords

EID: 0038406042     PISSN: 14346028     EISSN: None     Source Type: Journal    
DOI: 10.1140/epjb/e20020135     Document Type: Article

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