Nanodiffraction and dark-field STEM characterization of single-walled carbon nanotube ropes

Ultramicroscopy

Volumn 68, Issue 1, 1997, Pages 1-12

  Cowley, J M ^a   Sundell, F A ^a,b  

^a ARIZONA STATE UNIVERSITY   (United States)

^b CALIFORNIA POLYTECHNIC STATE UNIVERSITY   (United States)

Author keywords

Electron diffraction; Microscopic methods catalysts and small particles; STEM

Indexed keywords

CARBON; ELECTRON DIFFRACTION; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

CARBON NANOTUBES; ELECTRON NANODIFFRACTION;

NANOSTRUCTURED MATERIALS;

NANOPARTICLE;

ARTICLE; ELECTRON DIFFRACTION; IMAGE QUALITY; LASER; TRANSMISSION ELECTRON MICROSCOPY; ULTRASTRUCTURE;

EID: 0343145636     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00009-0     Document Type: Article

References (13)

1. S. Iijima, Nature 354 (1991) 56.
2. S. Iijima and T. Ichihashi, Nature 363 (1993) 603.
3. L. Chico, V.H. Crespi, L.X. Benedict, S.G. Louie and M.L. Cohen, Phys. Rev. Lett. 76 (1996) 971.
4. A. Thess, R. Lee, P. Nikolaev, H. Dai, P. Petit, J. Robert, C. Xu, Y.H. Lee, S.G. Kim, A.G. Rinzler, D.T. Colbert, G. Scuseria, D. Tománek, J.E. Fischer and R.E. Smalley, Science 273 (1996) 483.
5. C. Xu, D. T. Colbert, R. E. Smalley, G. E. Scuseria, in preparation.
6. N. Hamada, S. Sawada and A. Oshiyama, Phys. Rev. Lett. 68 (1992) 1579.
7. J.M. Cowley, P. Nikolaev, A. Thess and R.E. Smalley, Chem. Phys. Lett. 265 (1997) 379.
8. J.M. Cowley, Ultramicroscopy 49 (1993) 4.
9. J.M. Cowley, J. Electron. Micros. 45 (1996) 3.
10. R.-J. Liu and J.M. Cowley, J. Micros. Soc. Amer. 2 (1996) 9.
11. W. Cochran, F.H.C. Crick and V. Vand, Acta Crystallogr. 5 (1952) 581.
12. X.F. Zhang, X.B. Zhang, S. Amelinckx, G. Van Tenderloo and J. Van Landuyt, Ultramicroscopy 54 (1994) 237.
13. J.C.H. Spence and J.M. Cowley, Optik 50 (1978) 129.