On the measurement of helicity of carbon nanotubes

Ultramicroscopy

Volumn 67, Issue 1-4, 1997, Pages 181-189

  Qin, L C ^a   Ichihashi, T ^a   Iijima, S ^a  

^a NEC CORPORATION   (Japan)

Author keywords

Carbon nanotube; Electron diffraction; Helicity

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; ELECTRON DIFFRACTION; FUNCTIONS; MATHEMATICAL MODELS; NANOSTRUCTURED MATERIALS;

BESSEL FUNCTIONS; CARBON NANOTUBES; HELICITY;

CARBON;

ANALYTIC METHOD; ARTICLE; ELECTRON DIFFRACTION; EVAPORATION; GEOMETRY; ORIENTATION; STRUCTURE ANALYSIS;

EID: 0031171779     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(96)00095-2     Document Type: Article

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