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1
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29244448393
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Diffraction and diffuse scattering from dielectric multilayers
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J.M. Elson, "Diffraction and diffuse scattering from dielectric multilayers," J. Opt. Soc. Am. A 69, 682-694 (1976)
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(1976)
J. Opt. Soc. Am. A
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Elson, J.M.1
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2
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0018996455
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Light scattering from multilayer optics: Comparison of theory and experiment
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J. M. Elson, J. P. Rahn, and J. M. Bennett, "Light scattering from multilayer optics: comparison of theory and experiment," Appl. Opt. 19, 669-679 (1980).
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(1980)
Appl. Opt.
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Elson, J.M.1
Rahn, J.P.2
Bennett, J.M.3
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3
-
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0017507139
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Optical coating design with reduced electric field intensity
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J. H. Apfel, "Optical coating design with reduced electric field intensity," Appl. Opt. 16, (1977).
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(1977)
Appl. Opt.
, vol.16
-
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Apfel, J.H.1
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4
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29244456538
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Minimizing scattering in multilayers: Technique for searching optimal realization conditions
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C. Amra, " Minimizing scattering in multilayers: technique for searching optimal realization conditions," Proceedings of Laser induced damage in optical materials, 756, 265-271, (1987).
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(1987)
Proceedings of Laser Induced Damage in Optical Materials
, vol.756
, pp. 265-271
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Amra, C.1
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5
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0021515219
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Antiscattering transparent monolayers: Theory and experiment
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P. Roche, E. Pelletier, G. Albrand, "Antiscattering transparent monolayers: theory and experiment," J. Opt. Soc. Am. A 1, 1032, (1984).
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(1984)
J. Opt. Soc. Am. A
, vol.1
, pp. 1032
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Roche, P.1
Pelletier, E.2
Albrand, G.3
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6
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0005362244
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Theory and application of antiscattering single layers: Antiscattering antireflection coatings
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C. Amra, G. Albrand, P. Roche, "Theory and application of antiscattering single layers: antiscattering antireflection coatings," Appl. Opt. 25, 2695 (1986).
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(1986)
Appl. Opt.
, vol.25
, pp. 2695
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Amra, C.1
Albrand, G.2
Roche, P.3
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7
-
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0042951129
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Scattering reduction effect with overcoated rough surfaces: Theory and experiment
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H. Giovannini and C. Amra, "Scattering reduction effect with overcoated rough surfaces: theory and experiment," Appl. Opt., 36, pp. 5574-5579 (1997).
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(1997)
Appl. Opt.
, vol.36
, pp. 5574-5579
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Giovannini, H.1
Amra, C.2
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8
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84975655868
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The role of interface correlation in light scattering by a multilayer
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C. Amra, J. H. Apfel, E. Pelletier, "The role of interface correlation in light scattering by a multilayer," Appl. Opt. 31, 3134-3151 (1992).
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(1992)
Appl. Opt.
, vol.31
, pp. 3134-3151
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Amra, C.1
Apfel, J.H.2
Pelletier, E.3
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9
-
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0020834662
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Relationship of the total integrated scattering from multilayer-coated optics to angle of incidence, polarization, correlation-length, and roughness cross-correlation properties
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J.M. Elson, J.P. Rahn, and J.M. Bennett, "Relationship of the total integrated scattering from multilayer-coated optics to angle of incidence, polarization, correlation-length, and roughness cross-correlation properties," Appl. Opt. 22, 3207-3219 (1983)
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(1983)
Appl. Opt.
, vol.22
, pp. 3207-3219
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Elson, J.M.1
Rahn, J.P.2
Bennett, J.M.3
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10
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0030271035
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Low-level scattering and localized defects
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October 1
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S. Maure, G. Albrand and C. Amra, "Low-level scattering and localized defects," Appl. Opt. 35, no28, pp.5573-5582, October 1, 1996
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(1996)
Appl. Opt.
, vol.35
, Issue.28
, pp. 5573-5582
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Maure, S.1
Albrand, G.2
Amra, C.3
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11
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0028367822
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Light scattering from multilayer optics. Part A: Investigation tools
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C. Amra, "Light scattering from multilayer optics. Part A: investigation tools", J. Opt. Soc. Am. A11, 197-210 (1994)
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(1994)
J. Opt. Soc. Am. A
, vol.11
, pp. 197-210
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Amra, C.1
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12
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0028368291
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Light scattering from multilayer optics. Part B: Application to experiment
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and C. Amra, "Light scattering from multilayer optics. Part B: application to experiment," J. Opt. Soc. Am. A 11, 211-226 (1994)
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(1994)
J. Opt. Soc. Am. A
, vol.11
, pp. 211-226
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Amra, C.1
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13
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0001683938
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Polarization of out of plane scattering from microrough silicon
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T.A. Germer, C. Asmail, and B. W. Scheer, "Polarization of out of plane scattering from microrough silicon," Opt. Lett. 22, 1284 (1997)
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(1997)
Opt. Lett.
, vol.22
, pp. 1284
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Germer, T.A.1
Asmail, C.2
Scheer, B.W.3
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14
-
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0033724851
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Polarized light scattering measurements of polished and etched steel surfaces
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"Scattering and Surface Roughness III"
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T.A. Germer, T. Rinder, H. Rothe, "Polarized light scattering measurements of polished and etched steel surfaces", in "Scattering and Surface Roughness III," Proc. SPIE 4100, 148-155 (2000)
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(2000)
Proc. SPIE
, vol.4100
, pp. 148-155
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Germer, T.A.1
Rinder, T.2
Rothe, H.3
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15
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0000483260
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Polarization of light scattered by microrough surfaces and subsurface defects
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T.A. Germer and C. Asmail, "Polarization of light scattered by microrough surfaces and subsurface defects," J. Opt. Soc. Am. A 16, 1326 (1999)
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(1999)
J. Opt. Soc. Am. A
, vol.16
, pp. 1326
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Germer, T.A.1
Asmail, C.2
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16
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0030269610
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Ellipsometry of light scattering from multilayer coating
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C. Deumié, H. Giovannini and C. Amra, "Ellipsometry of light scattering from multilayer coating," Appl. Opt. 35, No 28, 5600-5608 (1996).
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(1996)
Appl. Opt.
, vol.35
, Issue.28
, pp. 5600-5608
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Deumié, C.1
Giovannini, H.2
Amra, C.3
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17
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-
0036602891
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Angle-resolved ellipsometry of light scattering: Discrimination of surface and bulk effects in substrates and optical coatings
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C. Deumié, H. Giovannini and C. Amra, "Angle-resolved ellipsometry of light scattering: discrimination of surface and bulk effects in substrates and optical coatings," Appl. Opt., 41, no 16, p 3362-3369, (2002).
-
(2002)
Appl. Opt.
, vol.41
, Issue.16
, pp. 3362-3369
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Deumié, C.1
Giovannini, H.2
Amra, C.3
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18
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-
21244491575
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Angle-resolved ellipsometry of scattering patterns from arbitrary surfaces and bulks
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O. Gilbert, C. Deumié and C. Amra, "Angle-resolved ellipsometry of scattering patterns from arbitrary surfaces and bulks," Opt. Express, 13, 2403-2418 (2005).
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(2005)
Opt. Express
, vol.13
, pp. 2403-2418
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-
Gilbert, O.1
Deumié, C.2
Amra, C.3
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19
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-
0001701356
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Goniometric optical scatter instrument for out-of-plane ellipsometry measurements
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Germer T.A. and Asmail C. C., "Goniometric optical scatter instrument for out-of-plane ellipsometry measurements," Rev. Sci. Instrum 70(9), 3688-3695 (1999).
-
(1999)
Rev. Sci. Instrum
, vol.70
, Issue.9
, pp. 3688-3695
-
-
Germer, T.A.1
Asmail, C.C.2
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20
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29044431707
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Characterizing interfacial roughness by light scattering ellipsometry
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"Characterization and Metrology for ULSI Technology: 2000 International Conference", AIP, New York
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T.A. Germer, "Characterizing interfacial roughness by light scattering ellipsometry," in "Characterization and Metrology for ULSI Technology: 2000 International Conference", Proc. AIP 550, 186-190, (AIP, New York, 2001)
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(2001)
Proc. AIP
, vol.550
, pp. 186-190
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Germer, T.A.1
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21
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0001248660
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Polarized light scattering by microroughness and small defects in dielectric layers
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T.A. Germer, "Polarized light scattering by microroughness and small defects in dielectric layers," J. Opt. Soc. Am. A 18, 1279 (2001)
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(2001)
J. Opt. Soc. Am. A
, vol.18
, pp. 1279
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Germer, T.A.1
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22
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0027543540
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First order vector theory of bulk scattering in optical multilayers
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C. Amra, "First order vector theory of bulk scattering in optical multilayers," J. Opt. Soc. Am. A 10, 365-374 (1993).
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(1993)
J. Opt. Soc. Am. A
, vol.10
, pp. 365-374
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Amra, C.1
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23
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84975605156
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Light scattering from the volume of optical thin films: Theory and experiment
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S. Kassam, A. Duparré, K. helm, P. Bussemer, and J. Neubert, "Light scattering from the volume of optical thin films: theory and experiment," Appl. Opt. 31, 1304-1313 (1992).
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(1992)
Appl. Opt.
, vol.31
, pp. 1304-1313
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-
Kassam, S.1
Duparré, A.2
Helm, K.3
Bussemer, P.4
Neubert, J.5
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24
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0027677835
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Comparison of surface and bulk scattering in optical coatings
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C. Amra, C. Grèzes-Besset, and L. Bruel, "Comparison of surface and bulk scattering in optical coatings," Appl. Opt. 32, 5492-5503 (1993).
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(1993)
Appl. Opt.
, vol.32
, pp. 5492-5503
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Amra, C.1
Grèzes-Besset, C.2
Bruel, L.3
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25
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3342912321
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Theory of light scattering from rough surfaces and interfaces and from volume inhomogeneities in an optical layer stack
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11. P. Bussemer, K. Hehl, and S. Kassam, "Theory of light scattering from rough surfaces and interfaces and from volume inhomogeneities in an optical layer stack," Waves in Random Media, 1, 207-221 (1991).
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(1991)
Waves in Random Media
, vol.1
, pp. 207-221
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Bussemer, P.1
Hehl, K.2
Kassam, S.3
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26
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0027677462
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Multiwavelength (0.45 - 10.6 μm) angle-resolved scatterometer or how to extend the optical window
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C. Amra, D. Torricini, and P. Roche, "Multiwavelength (0.45 - 10.6 μm) angle-resolved scatterometer or how to extend the optical window," Appl. Opt., 32, 5462-5474 (1993).
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(1993)
Appl. Opt.
, vol.32
, pp. 5462-5474
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Amra, C.1
Torricini, D.2
Roche, P.3
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27
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84971961740
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Boundary integral equations for the scattering of electromagnetic waves by a homogeneous dielectric obstacle
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P. A. Martin and P. Ola, "Boundary integral equations for the scattering of electromagnetic waves by a homogeneous dielectric obstacle," Proc. Roy. Soc. Edinburgh, 123A, pp. 185-208, (1993).
-
(1993)
Proc. Roy. Soc. Edinburgh
, vol.123 A
, pp. 185-208
-
-
Martin, P.A.1
Ola, P.2
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28
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0035394370
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Rigorous solution for electromagnetic scattering from rough surfaces
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M. Saillard and A. Sentenac, "Rigorous solution for electromagnetic scattering from rough surfaces," Waves in Random Media, 11, 103-137 (2001).
-
(2001)
Waves in Random Media
, vol.11
, pp. 103-137
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Saillard, M.1
Sentenac, A.2
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