Polarized light scattering measurements of polished and etched steel surfaces

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4100, Issue , 2000, Pages 148-155

  Germer, Thomas A ^a   Rinder, Thomas ^a   Rothe, Hendrik ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CORRELATION METHODS; ELLIPSOMETRY; LIGHT POLARIZATION; PERMITTIVITY; POLARIMETERS; POLISHING; STEEL; SURFACE MEASUREMENT; SURFACE ROUGHNESS;

MICROROUGHNESS; POWER SPECTRAL DENSITY; SCATTERING ELLIPSOMETRY; STEEL SURFACE;

LIGHT SCATTERING;

EID: 0033724851     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (18)