Low-level scattering and localized defects

Applied Optics

Volumn 35, Issue 28, 1996, Pages 5573-5582

  Maure, Sophie ^a   Albrand, Gérard ^a   Amra, Claude ^a  

^a CNRS   (France)

Author keywords

Bulk inhomogeneity; Ion plating; Ion assisted deposition; Light scattering; Localized defects; Optical filters; Polarization ratio; Surface roughness; Thin films

Indexed keywords

DEFECTS; DEPOSITION; FOURIER TRANSFORMS; ION BEAMS; LIGHT POLARIZATION; MATHEMATICAL MODELS; OPTICAL COATINGS; OPTICAL FILTERS; SILICON WAFERS; SURFACE ROUGHNESS; THIN FILMS;

BULK INHOMOGENEITY; ION ASSISTED DEPOSITION; ION PLATING; LOCALIZED DEFECTS; LOW LEVEL SCATTERING; POLARIZATION RATIO;

LIGHT SCATTERING;

EID: 0030271035     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.35.005573     Document Type: Article

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