Angle-resolved ellipsometry of scattering patterns from arbitrary surfaces and bulks

Optics Express

Volumn 13, Issue 7, 2005, Pages 2403-2418

  Gilbert, Olivier ^a   Deumié, Carole ^a   Amra, Claude ^a  

^a Institut Fresnel   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DATA ACQUISITION; ELLIPSOMETRY; FIBER OPTICS; INTERFACES (MATERIALS); LIGHT POLARIZATION; MULTILAYERS; PHASE TRANSITIONS; SPECKLE; SURFACE ROUGHNESS;

BULK SCATTERING; PHASE DATA; SCATTERING LEVELS; SURFACE SCATTERING;

LIGHT SCATTERING;

EID: 21244491575     PISSN: 10944087     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OPEX.13.002403     Document Type: Article

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