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Volumn 41, Issue 16, 2002, Pages 3362-3369

Angle-resolved ellipsometry of light scattering: Discrimination of surface and bulk effects in substrates and optical coatings

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EID: 0036602891     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.41.003362     Document Type: Article
Times cited : (20)

References (29)
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