Determination of in-depth probe response function using spectral perturbation methods

Journal of Applied Physics

Volumn 98, Issue 11, 2005, Pages

  Wan, Keshu ^a   Zhu, Wenliang ^a   Pezzotti, Giuseppe ^a  

^a KYOTO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

FOCAL PLANE; LASER PROBE SIZE; LINEAR STRESS FIELD; PROBE RESPONSE FUNCTIONS; RECIPROCAL CONSISTENCY; SAPPHIRE FILM; SPECTRAL INTENSITY DISTRIBUTION;

CALIBRATION; COATINGS; FUNCTIONS; PERTURBATION TECHNIQUES; SPECTROMETERS; SPECTROSCOPY;

PROBES;

EID: 29144485433     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2134886     Document Type: Article

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