Online BIST for embedded systems

IEEE Design and Test of Computers

Volumn 15, Issue 4, 1998, Pages 17-24

  Al Asaad, Hussain ^a   Murray, Brian T ^a   Hayes, John P ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NONCURRENT TESTING;

BUILT-IN SELF TEST; COMPUTER SYSTEMS PROGRAMMING; ERROR DETECTION; FAULT TOLERANT COMPUTER SYSTEMS; ONLINE SYSTEMS;

EMBEDDED SYSTEMS;

EID: 0032179724     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/54.735923     Document Type: Article

References (10)