Effective software-based self-test strategies for on-line periodic testing of embedded processors

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 24, Issue 1, 2005, Pages 88-98

  Paschalis, Antonis ^a   Gizopoulos, Dimitris ^b  

^a UNIVERSITY OF ATHENS   (Greece)

^b UNIVERSITY OF PIRAEUS   (Greece)

Author keywords

Intermittent faults; On line testing; Periodic testing; Processor testing; Software based self test (SBST)

Indexed keywords

COMPUTER ARCHITECTURE; COMPUTER HARDWARE; COMPUTER SOFTWARE; ELECTRIC DISCHARGES; ELECTROSTATICS; MICROPROCESSOR CHIPS; REDUNDANCY; SIGNAL INTERFERENCE;

INTERMITTENT FAULTS; ON-LINE TESTING; PERIODIC TESTING; PROCESSOR TESTING; SOFTWARE-BASED SELF-TEST (SBST);

EMBEDDED SYSTEMS;

EID: 11844269173     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2004.839486     Document Type: Conference Paper

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