Dependence of electrical properties of epitaxial Pb(Zr,Ti)O 3 thick films on crystal orientation and Zr/(Zr+Ti) ratio

Journal of Applied Physics

Volumn 98, Issue 9, 2005, Pages

  Yokoyama, Shintaro ^a   Honda, Yoshihisa ^a   Morioka, Hitoshi ^a   Okamoto, Shoji ^a   Funakubo, Hiroshi ^a   Iijima, Takashi ^b   Matsuda, Hirofumi ^b   Saito, Keisuke ^c   Yamamoto, Takashi ^d   Okino, Hirotake ^d   Sakata, Osami ^e   Kimura, Shigeru ^e,f  

^a Tokyo Institute of Technology J2 43 ^*  (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^c BRUKER AXS INC   (United States)

^d NATIONAL DEFENSE ACADEMY   (Japan)

^e JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^f JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

PHASE CHANGE; SINGLE PHASE;

CRYSTAL ORIENTATION; ELECTRIC POTENTIAL; EPITAXIAL GROWTH; METALLORGANIC CHEMICAL VAPOR DEPOSITION; MIXTURES;

LEAD COMPOUNDS;

EID: 27844488019     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2126156     Document Type: Article

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