Hole transport and carrier lifetime in InN epilayers

Applied Physics Letters

Volumn 87, Issue 21, 2005, Pages 1-3

  Chen, Fei ^a   Cartwright, A N ^a   Lu, Hai ^b   Schaff, William J ^b  

^a the State University of New York   (United States)

^b Cornell University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER LIFETIME; EPILAYERS; GRATING PERIODS; TRANSIENT GRATING SPECTROSCOPY;

DIFFUSION; HOLE MOBILITY; IMPURITIES; INTERFACES (MATERIALS); LIGHT SCATTERING; SPECTROSCOPIC ANALYSIS;

SEMICONDUCTING INDIUM COMPOUNDS;

EID: 27844447281     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2133892     Document Type: Article

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