Estimation of the electron beam energy spread for TEM information limit

Microscopy and Microanalysis

Volumn 8, Issue SUPPL. 2, 2002, Pages 480-481

  O'Keefe, Michael ^a   Tiemeijer, Peter ^b   Sidorov, Maxim ^c  

^a National Center for Electron Microscopy   (United States)

^b Thermo Fisher Scientific   (United States)

^c ADVANCED MICRO DEVICES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0036415305     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927602105344     Document Type: Conference Paper

References (14)

1. M.A. O'Keefe et al., Ultramicroscopy 89 (2001) 4: 215-241.
2. M.A. O'Keefe et al., 59th Ann. Proc. MSA, Long Beach, California (2001) 898-899.
3. M.A. O'Keefe, E.C. Nelson, Y.C. Wang & A. Thust, Philosophical Magazine B 81 (2001) 11: 1861-1878.
4. W.M.J. Coene, A. Thust, M. Op de Beeck & D. Van Dyck, Ultramicroscopy 64 (1996) 109-135.
5. A. Thust, W.M.J. Coene, M. Op de Beeck & D. Van Dyck, Ultramicroscopy 64 (1996) 211-230.
6. C. Kisielowski et al., Ultramicroscopy 89 (2001) 4: 243-263.
7. A. Ziegler, C. Kisielowski & R.O. Ritchie, Acta Mat. 50 (2002) 565-574.
8. E. Principe et al. (2002) to be published.
9. P.C. Tiemeijer, Ultramicroscopy 78 (1999) 53-62.
10. M.J. Fransen et al., Advances in Imaging and Electron Optics III (1999) 91.
11. J.H. Turner, M.A. O'Keefe & R. Mueller, 55th Ann. Proc. MSA, Cleveland, Ohio (1997) 1177-1178.
12. Maxim V. Sidorov (2002), these proceedings.
13. M.A. O'Keefe, 59th Ann. Proc. MSA, Long Beach, California (2001) 916-917.
14. Work supported by the Director, Office of Science, through the Office of Basic Energy Sciences, Material Sciences Division, of the U.S. Department of Energy, under contract No. DE-AC03-76SF00098.