ReStore: Symptom based soft error detection in microprocessors

Proceedings of the International Conference on Dependable Systems and Networks

Volumn , Issue , 2005, Pages 30-39

  Wang, Nicholas J ^a   Patel, Sanjay J ^a  

^a University of Illinois at Urbana Champaign   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEVICE SCALING; PARITY PROTECTION; PIPELINE STRUCTURES; SOFT ERRORS;

BUFFER STORAGE; COMPUTER ARCHITECTURE; HARDWARE; LSI CIRCUITS; MICROPROCESSOR CHIPS;

ERROR DETECTION;

EID: 27544488480     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DSN.2005.82     Document Type: Conference Paper

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