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Applied Surface Science

Volumn 252, Issue 4, 2005, Pages 1147-1152

Characterization of cubic phase MgZnO/Si(1 0 0) interfaces

(6) Liang, J a Wu, H Z a Lao, Y F a Chen, N B b Yu, P b Xu, T N b

a SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY (China)

b ZHEJIANG UNIVERSITY (China)

Author keywords

Band offset; Leakage mechanism; MgZnO thin film; MIS structure

Indexed keywords

ELECTRIC FIELD EFFECTS; HETEROJUNCTIONS; LEAKAGE CURRENTS; MAGNESIUM COMPOUNDS; MICROSTRUCTURE; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

BAND OFFSET; LEAKAGE MECHANISM; MGZNO THIN FILM; MIS STRUCTURE;

INTERFACES (MATERIALS);

EID: 26444501364 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/j.apsusc.2005.02.038 Document Type: Article

Times cited : (12)

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