Intersecting basal plane and prismatic stacking fault structures and their formation mechanisms in GaN

Journal of Applied Physics

Volumn 98, Issue 6, 2005, Pages

  Bai, J ^a   Huang, X ^a   Dudley, M ^a   Wagner, B ^b   Davis, R F ^b   Wu, L ^c   Sutter, E ^c   Zhu, Y ^c   Skromme, B J ^d  

^a Stony Brook University   (United States)

^b North Carolina State University   (United States)

^c BROOKHAVEN NATIONAL LABORATORY   (United States)

^d Arizona State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BASAL PLANE STACKING FAULTS (BSF); LATTICE DISCONNECTIONS; PRISMATIC STATIC FAULTS (PSF); STAIR-ROD DISLOCATIONS;

CRYSTAL STRUCTURE; DISLOCATIONS (CRYSTALS); FILM GROWTH; GRAIN BOUNDARIES; LATTICE CONSTANTS; SILICON CARBIDE; STACKING FAULTS;

GALLIUM COMPOUNDS;

EID: 26244459401     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2039278     Document Type: Article

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