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Volumn 189-190, Issue , 1998, Pages 193-196
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Origin of cracks in GaN/AlGaN DH structure grown on 6H-SiC by metalorganic vapor phase epitaxy
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Author keywords
[No Author keywords available]
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Indexed keywords
CRACKS;
HETEROJUNCTIONS;
INTERFACES (MATERIALS);
METALLORGANIC VAPOR PHASE EPITAXY;
SEMICONDUCTING ALUMINUM COMPOUNDS;
SEMICONDUCTOR DEVICE STRUCTURES;
SEMICONDUCTOR GROWTH;
SILICON CARBIDE;
SUBSTRATES;
THERMAL EXPANSION;
DOUBLE HETERO (DH) STRUCTURES;
SEMICONDUCTING GALLIUM COMPOUNDS;
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EID: 0032090758
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(98)00200-0 Document Type: Article |
Times cited : (10)
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References (7)
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