High resolution transmission electron microscopy studies of metal/ceramics interfaces

Microscopy Research and Technique

Volumn 40, Issue 3, 1998, Pages 206-241

  Ikuhara, Yuichi ^a   Pirouz, Pirouz ^b  

^a UNIVERSITY OF TOKYO   (Japan)

^b Case Western Reserve University   (United States)

Author keywords

Coherent interface; Critical thickness; Crystal tilt; Geometrical misfit dislocation; Incoherent interface; Magnesium oxide; Misfit dislocation; Sapphire; Vanadium

Indexed keywords

CRYSTAL ORIENTATION; DISLOCATIONS (CRYSTALS); HETEROJUNCTIONS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; INTERFACES (MATERIALS); LATTICE MISMATCH; SAPPHIRE; SINGLE CRYSTALS; VANADIUM;

COHERENT INTERFACE; CRITICAL THICKNESS; CRYSTAL TILT; GEOMETRICAL MISFIT DISLOCATION; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; INCOHERENT INTERFACES; METAL-CERAMIC INTERFACE; MISMATCHED SYSTEMS; ORIENTATION RELATIONSHIP; SHARP INTERFACE;

MAGNESIA;

MAGNESIUM OXIDE; VANADIUM;

ARTICLE; CERAMICS; CRYSTAL STRUCTURE; MODEL; PRIORITY JOURNAL; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0032007341     PISSN: 1059910X     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-0029(19980201)40:3<206::AID-JEMT4>3.0.CO;2-S     Document Type: Article

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