-
1
-
-
0029004946
-
-
Kirz, J., Jacobsen, C., and Howells, M., 1995. Q. Rev. Biophys., 28: 33–130.
-
(1995)
Q. Rev. Biophys.
, vol.28
, pp. 33-130
-
-
Kirz, J.1
Jacobsen, C.2
Howells, M.3
-
2
-
-
0000543945
-
-
Schmahl, G., Rudolph, D., Guttmann, P., Schneider, G., Thieme, J., and Niemann, B., 1995. Rev. Sci. Instntm., 66: 1282–1286.
-
(1995)
Rev. Sci. Instntm.
, vol.66
, pp. 1282-1286
-
-
Schmahl, G.1
Rudolph, D.2
Guttmann, P.3
Schneider, G.4
Thieme, J.5
Niemann, B.6
-
3
-
-
0036638645
-
-
Guenther, S., Kaulich, B., Gregoratti, L., and Kiskinova, M., 2002. Prog. Surf. Sci., 70: 187–260.
-
(2002)
Prog. Surf. Sci.
, vol.70
, pp. 187-260
-
-
Guenther, S.1
Kaulich, B.2
Gregoratti, L.3
Kiskinova, M.4
-
4
-
-
0038702041
-
In: X-ray Microscopy 2002 (J. Susini, F. Polack, and D. Joyeux, eds.)
-
Feser, M., Jacobsen, C., Rehak, P., and DeGeronimo, G., 2003. In: X-ray Microscopy 2002 (J. Susini, F. Polack, and D. Joyeux, eds.). J. Physique IV, 104: 529–534.
-
(2003)
J. Physique IV
, vol.104
, pp. 529-534
-
-
Feser, M.1
Jacobsen, C.2
Rehak, P.3
DeGeronimo, G.4
-
5
-
-
0012991497
-
Scanning electron microscopy
-
Zeitler, E., and Thomson, M. G. R., 1970. “Scanning electron microscopy,”. Optik (Stuttgart), 31: 258–280.
-
(1970)
Optik (Stuttgart)
, vol.31
, pp. 258-280
-
-
Zeitler, E.1
Thomson, M.G.R.2
-
6
-
-
0037687961
-
In: X-ray microscopy 2002 (J. Susini, F. Polack, and D. Joyeux, eds.)
-
Di Fabrizio, E., Cojoc, D., Cabrini, S., Kaulich, B., Wilhein, T., and Susini, J., 2003. In: X-ray microscopy 2002 (J. Susini, F. Polack, and D. Joyeux, eds.). J. Physique IV, 104: 177–183.
-
(2003)
J. Physique IV
, vol.104
, pp. 177-183
-
-
Di Fabrizio, E.1
Cojoc, D.2
Cabrini, S.3
Kaulich, B.4
Wilhein, T.5
Susini, J.6
-
7
-
-
0001336564
-
-
Aristov V.V., Erko A., (eds), Chernologovka, Moscow Region: Bogorodskii Pechnatnik, and, Edited by
-
Niemann, B., Schneider, G., Guttmann, P., Rudolph, D., and Schmahl, G., 1994. X-ray microscopy IV, Edited by: Aristov, V. V., and Erko, A., 66–75. Chernologovka, Moscow Region: Bogorodskii Pechnatnik.
-
(1994)
X-ray microscopy IV
, pp. 66-75
-
-
Niemann, B.1
Schneider, G.2
Guttmann, P.3
Rudolph, D.4
Schmahl, G.5
-
8
-
-
22244483810
-
-
Kaulich, B., Oestreich, S., Salome, M., Barrett, R., Susini, J., Wilhein, T., Di Fabrizio, E., Gentili, M., and Charalambous, P., 1999. Appl. Phys. Lett., 75: 4061–4063.
-
(1999)
Appl. Phys. Lett.
, vol.75
, pp. 4061-4063
-
-
Kaulich, B.1
Oestreich, S.2
Salome, M.3
Barrett, R.4
Susini, J.5
Wilhein, T.6
Di Fabrizio, E.7
Gentili, M.8
Charalambous, P.9
-
10
-
-
85071345360
-
-
J. Susini et al., this issue
-
J. Susini et al., this issue.
-
-
-
-
11
-
-
85071345198
-
-
McNulty I., (ed), and, Edited by
-
David, C., Nohammer, B., Solak, H., Haas, B., Glaus, F., van der Veen, F., Schlott, V., Bongaerts, J., Kaulich, B., and Susini, J., 2002. X-ray Microscopy and Nano-Focusing: Applications and Techniques II, SPIE Proc. 4779 Edited by: McNulty, I., 85–95.
-
(2002)
X-ray Microscopy and Nano-Focusing: Applications and Techniques II
, pp. 85-95
-
-
David, C.1
Nohammer, B.2
Solak, H.3
Haas, B.4
Glaus, F.5
van der Veen, F.6
Schlott, V.7
Bongaerts, J.8
Kaulich, B.9
Susini, J.10
-
12
-
-
0001500788
-
-
David, C., Kaulich, B., Barrett, R., Salome, M., and Susini, J., 2000. Appl. Phys. Lett., 77: 3851–3853.
-
(2000)
Appl. Phys. Lett.
, vol.77
, pp. 3851-3853
-
-
David, C.1
Kaulich, B.2
Barrett, R.3
Salome, M.4
Susini, J.5
-
13
-
-
0033613416
-
-
Di Fabrizio, E., Romanato, F., Gentili, M., Cabrini, S., Susini, J., and Barrett, R., 1999. Nature, 401: 895–898.
-
(1999)
Nature
, vol.401
, pp. 895-898
-
-
Di Fabrizio, E.1
Romanato, F.2
Gentili, M.3
Cabrini, S.4
Susini, J.5
Barrett, R.6
-
14
-
-
0038702308
-
In: X-ray microscopy 2002 (J. Susini, F. Polack, and D. Joyeux, eds.)
-
Charalambous, P., 2003. In: X-ray microscopy 2002 (J. Susini, F. Polack, and D. Joyeux, eds.). J. Physique IV, 104: 185–188.
-
(2003)
J. Physique IV
, vol.104
, pp. 185-188
-
-
Charalambous, P.1
-
15
-
-
0038363753
-
In: X-ray Microscopy 2002 (J. Susini, F. Polack, and D. Joyeux, eds.)
-
Morrison, G. R., Eaton, W. J., Barrett, R., and Charalambous, P. S., 2003. In: X-ray Microscopy 2002 (J. Susini, F. Polack, and D. Joyeux, eds.). J. de Physique IV, 104: 547–550.
-
(2003)
J. de Physique IV
, vol.104
, pp. 547-550
-
-
Morrison, G.R.1
Eaton, W.J.2
Barrett, R.3
Charalambous, P.S.4
-
16
-
-
0035794383
-
-
Wilhein, T., Kaulich, B., Di Fabrizio, E., Romanato, F., Cabrini, S., and Susini, J., 2001. Appl. Phys. Lett., 78: 2082–2084.
-
(2001)
Appl. Phys. Lett.
, vol.78
, pp. 2082-2084
-
-
Wilhein, T.1
Kaulich, B.2
Di Fabrizio, E.3
Romanato, F.4
Cabrini, S.5
Susini, J.6
-
17
-
-
0013408921
-
-
Kaulich, B., Wilhein, T., Di Fabrizio, E., Romanato, F., Altissimo, M., Cabrini, S., Fayard, B., and Susini, J., 2002. J. Opt. Soc. Am. A, 19: 797–806.
-
(2002)
J. Opt. Soc. Am. A
, vol.19
, pp. 797-806
-
-
Kaulich, B.1
Wilhein, T.2
Di Fabrizio, E.3
Romanato, F.4
Altissimo, M.5
Cabrini, S.6
Fayard, B.7
Susini, J.8
-
18
-
-
0037924483
-
-
Kaulich, B., Polack, F., Neuhaeusler, U., Susini, J., Di Fabrizio, E., and Wilhein, T., 2002. Opt. Express, 10: 1111–1117.
-
(2002)
Opt. Express
, vol.10
, pp. 1111-1117
-
-
Kaulich, B.1
Polack, F.2
Neuhaeusler, U.3
Susini, J.4
Di Fabrizio, E.5
Wilhein, T.6
-
19
-
-
0035572693
-
-
Lucas P.W., Webber S., (eds), Chicago: and, Edited by
-
Diviacco, B., Bracco, R., Millo, D., Zalateu, M., Zangrando, D., and Walker, R. P., 2001. Proc. of the 2001 Particle Accelerator Conference, IEEE 2001 Edited by: Lucas, P. W., and Webber, S., 2468–2470. Chicago
-
(2001)
Proc. of the 2001 Particle Accelerator Conference
, pp. 2468-2470
-
-
Diviacco, B.1
Bracco, R.2
Millo, D.3
Zalateu, M.4
Zangrando, D.5
Walker, R.P.6
|