Scanning transmission X-ray microscopy with a segmented detector

Journal De Physique. IV : JP

Volumn 104, Issue , 2003, Pages 529-534

  Feser, M ^a   Jacobsen, C ^a   Rehak, P ^b   DeGeronimo, G ^b  

^a STONY BROOK UNIVERSITY   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FOURIER TRANSFORMS; GEOMETRY; METAL DETECTORS; PHASE SHIFT; PHOTONS; QUANTUM EFFICIENCY; SIGNAL FILTERING AND PREDICTION; SILICON; TRANSFER FUNCTIONS; X RAY MICROSCOPES;

FOURIER FILTERING METHOD; SCANNING TRANSMISSION X RAY MICROSCOPY; SEGMENTED SILICON DETECTOR; X RAY OPTICAL CONSTANTS;

MICROSCOPIC EXAMINATION;

EID: 0038702041     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1051/jp4:20030138     Document Type: Conference Paper

References (10)

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