Differential interference contrast x-ray microscopy with twin zone plates

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 19, Issue 4, 2002, Pages 797-806

  Kaulich, Burkhard ^a   Wilhein, Thomas ^b   Di Fabrizio, Enzo ^a   Romanato, Filippo ^a   Altissimo, Matteo ^a   Cabrini, Stefano ^c   Fayard, Barbara ^d   Susini, Jean ^d  

^a SINCROTRONE TRIESTE   (Italy)

^b UNIVERSITY OF APPLIED SCIENCES   (Germany)

^c Inst Elletron della Stato Solido   (Italy)

^d EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; OPTICAL RESOLVING POWER; PLATES (STRUCTURAL COMPONENTS); SCANNING; X RAY MICROSCOPES;

DIFFERENTIAL INTERFERENCE CONTRAST (DIC);

LIGHT INTERFERENCE;

EID: 0013408921     PISSN: 10847529     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAA.19.000797     Document Type: Article

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