Feasibility of transmission x-ray microscopy at 4 keV with spatial resolutions below 150 nm

Applied Physics Letters

Volumn 75, Issue 26, 1999, Pages 4061-4063

  Kaulich, B ^a   Oestreich, S ^a   Salome, M ^a   Barrett, R ^a   Susini, J ^a   Wilhein, T ^b   Di Fabrizio, E ^c   Gentili, M ^c   Charalambous, P ^d  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b UNIVERSITY OF GÖTTINGEN   (Germany)

^c CNR   (Italy)

^d KING'S COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 22244483810     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125536     Document Type: Article

References (14)

1. W. Meyer-Ilse, H. Medecki, L. Jochum, E. Anderson, D. Attwood, C. Magowan, R. Balhorn, M. Moronne, D. Rudolph, and G. Schmahl, Synchrotron Radiation News 8, 29 (1995)
2. G. Schmahl, D. Rudolph, B. Niemann, P. Guttmann, J. Thieme, G. Schneider, C. David, M. Diehl, and T. Wilhein, Optik (Stuttgart) 93, 95 (1994).
3. R. Medenwaldt, J. Abraham-Peskir, and E. Uggerhoj, Synchrotron Radiation News 11, No. 1, 38 (1998).
4. J. Susini, and R. Barrett, in X-ray Microscopy and Microspectroscopy, edited by J. Thieme, E. Umbach, D. Rudolph, and G. Schmahl (Springer, Heidelberg, 1998), p. I-30.
5. B. Kaulich, S. Oestreich, R. Barrett, and J. Susini, Microsc. Anal. 4 (Suppl 2: Proceedings), 374 (1998).
6. S. Oestreich, B. Kaulich, and J. Susini, Rev. Sci. Instrum. 70, 1921 (1999).
7. E. Di Fabrizio, L. Grella, M. Gentili, L. Peschiaroli, L. Mastrogiacomo, and R. Maggiora, J. Vac. Sci. Technol. B 14, 3855 (1998).
8. E. Di Fabrizio, F. Romanato, S. Cabrini, M. Gentili, B. Kaulich, J. Susini, and R. Barrett, Nature (London) 401, 895 (1999).
9. P. Charalambous, in X-ray Microscopy IV, edited by V. V. Aristov and A. I. Erko (Bogorodski Pechatnik, Chernologovka, Russia, 1994), p. 510.
10. M. Pateyron, F. Peyrin, A. M. Laval-Jeantet, P. Spanne, P. Cloetens, and G. Peix, SPIE 2708, 417 (1996).
11. M. Salome, F. Peyrin, P. Cloetens, C. Odet, A. Laval-Jeantet, J. Baruchel, and P. Spanne, Med. Phys. 26, 2194 (1999).
12. A. Koch and C. Riekel, Rev. Sci. Instrum. 67, 1737 (1999).
13. B. Niemann, Patent Application Nos. DE 196 00 701.1 and DE 196 33 047.5, German Patent Office (1996).
14. S. Oestreich, G. Rostaing, B. Niemann, B. Kaulich, J. Susini, and R. Barrett, in Proceedings of the 6th International Conference of X-ray Microscopy, Berkeley, CA, 1-6 August 1999 (unpublished).