|
Volumn 491, Issue 1-2, 2005, Pages 29-37
|
Beryllium-doped polycrystalline GaN films: Optical and grain boundary properties
|
Author keywords
GaN; Grain boundary scattering
|
Indexed keywords
ATOMIC FORCE MICROSCOPY;
BERYLLIUM;
DOPING (ADDITIVES);
GALLIUM NITRIDE;
GRAIN BOUNDARIES;
PHOTOLUMINESCENCE;
POLYCRYSTALLINE MATERIALS;
SCANNING ELECTRON MICROSCOPY;
SPUTTERING;
X RAY DIFFRACTION;
GAN;
GRAIN BOUNDARY SCATTERING;
MICROSTRUCTURAL INFORMATION;
RADIO FREQUENCY SPUTTERING;
SEMICONDUCTING FILMS;
|
EID: 25144493194
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2005.04.117 Document Type: Article |
Times cited : (9)
|
References (27)
|