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Volumn 491, Issue 1-2, 2005, Pages 29-37

Beryllium-doped polycrystalline GaN films: Optical and grain boundary properties

Author keywords

GaN; Grain boundary scattering

Indexed keywords

ATOMIC FORCE MICROSCOPY; BERYLLIUM; DOPING (ADDITIVES); GALLIUM NITRIDE; GRAIN BOUNDARIES; PHOTOLUMINESCENCE; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; SPUTTERING; X RAY DIFFRACTION;

EID: 25144493194     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.04.117     Document Type: Article
Times cited : (9)

References (27)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.