Visualization of thermally-activated degradation pathways of tris(8-hydroxyquinoline) aluminum thin films for electroluminescence application

Thin Solid Films

Volumn 491, Issue 1-2, 2005, Pages 317-322

  Xu, M S ^a   Xu, J B ^a  

^a CHINESE UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

Atomic Force Microscopy (AFM); Heat treatment; Organic semiconductors; Surface morphology

Indexed keywords

ALUMINUM; ATOMIC FORCE MICROSCOPY; CRYSTALLIZATION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GLASS; GLASS TRANSITION; HEAT TREATMENT; SEMICONDUCTING ORGANIC COMPOUNDS; SURFACES; VISUALIZATION;

ALUMINUM THIN FILMS; APPARENT GLASS TRANSITION; DEGRADATION PATHWAYS; THERMAL ACTIVATION;

METALLIC FILMS;

EID: 25144466962     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.05.025     Document Type: Article

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