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Journal of Applied Physics

Volumn 85, Issue 4, 1999, Pages 2441-2447

Lifetime and degradation effects in polymer light-emitting diodes

(3) Parker, I D a Cao, Y a Yang, C Y b

a DUPONT COMPANY (United States)

b UNIVERSITY OF CALIFORNIA (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER MOBILITY; CURRENT DENSITY; DEGRADATION; ELECTRON TRANSPORT PROPERTIES; HOLE TRAPS; SEMICONDUCTING POLYMERS; SEMICONDUCTOR DEVICE MANUFACTURE; TEMPERATURE;

DEGRADATION EFFECTS; DEVICE OPERATING VOLTAGE; LUMINANCES;

LIGHT EMITTING DIODES;

EID: 0033556932 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.369564 Document Type: Article

Times cited : (199)

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