Nanoscale study on origins of the bright clusters in/on moisture-exposed tris(8-hydroxyquinoline) aluminum thin films

Synthetic Metals

Volumn 145, Issue 2-3, 2004, Pages 177-182

  Xu, M S ^a   Xu, J B ^a  

^a CHINESE UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

Degradation; Organic light emitting diodes; Tris(8 hydroxyquinoline) aluminum; Variable temperature tapping mode atomic force microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONDENSATION; CRYSTAL STRUCTURE; CRYSTALLINE MATERIALS; CRYSTALLIZATION; DEGRADATION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GRAIN GROWTH; LIGHT EMITTING DIODES; MOISTURE CONTROL; NANOSTRUCTURED MATERIALS; THIN FILMS; X RAY DIFFRACTION;

MOISTURE-INDUCED DEGRADATION; ORGANIC LIGHT EITTING DIODES; TRIS(8-HYDROXYQUINOLINE) ALUMINUM; VARIABLE TEMPERATURE TAPPING MODE ATOMIC FORCE MICROSCOPY;

ALUMINUM;

EID: 4344609581     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.synthmet.2004.05.017     Document Type: Article

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