Thermally induced failure mechanisms of organic light emitting device structures probed by X-ray specular reflectivity

Chemical Physics Letters

Volumn 277, Issue 5-6, 1997, Pages 521-526

  Fenter, P ^a,c   Schreiber, F ^a   Bulovic V ^a,b   Forrest, S R ^a,b  

^a Princeton University   (United States)

^b PRINCETON UNIVERSITY   (United States)

^c ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0031576276     PISSN: 00092614     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0009-2614(97)00941-X     Document Type: Article

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