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Volumn 81, Issue 2, 2002, Pages 370-372

Organic light emitting devices with enhanced operational stability at elevated temperatures

Author keywords

[No Author keywords available]

Indexed keywords

ACCELERATED DEGRADATION TESTS; DEGRADATION MECHANISM; DEVICE DEGRADATION; ELECTROLUMINESCENCE DEGRADATION; ELECTRON TRANSPORT LAYERS; ELEVATED TEMPERATURE; EMITTING LAYER; OPERATIONAL STABILITY; ORGANIC LIGHT-EMITTING DEVICES; QUINACRIDONE; TEMPERATURE DEPENDENCE OF ELECTROLUMINESCENCE; TRIS(8-HYDROXYQUINOLINE) ALUMINUM;

EID: 79956015530     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1491002     Document Type: Article
Times cited : (110)

References (16)
  • 2
  • 13
    • 0000401784 scopus 로고    scopus 로고
    • jaJAPIAU 0021-8979
    • J. Shen and J. Yang, J. Appl. Phys. 87, 3891 (2000). jap JAPIAU 0021-8979
    • (2000) J. Appl. Phys. , vol.87 , pp. 3891
    • Shen, J.1    Yang, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.