Degradation of organic electroluminescent devices. Evidence for the occurrence of spherulitic crystallization in the hole transport layer

Langmuir

Volumn 14, Issue 20, 1998, Pages 5946-5950

  Smith, P F ^a   Gerroir, P ^a   Xie, S ^a   Hor, A M ^a   Popovic, Z ^a   Hair, M L ^b  

^a XEROX RESEARCH CENTRE OF CANADA   (Canada)

^b UNIVERSITY OF TORONTO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ANODES; ATOMIC FORCE MICROSCOPY; CRYSTALLIZATION; DEGRADATION; DELAMINATION; ELECTRON MICROSCOPY; NUCLEATION; ORGANIC COMPOUNDS; X RAY ANALYSIS;

ENERGY DISPERSIVE X RAY ANALYSIS; HOLE TRANSPORT LAYERS; ORGANIC ELECTROLUMINESCENT DEVICES; SPHERULITES;

LUMINESCENT DEVICES;

EID: 0032164609     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la9709406     Document Type: Article

References (10)

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