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Applied Physics Letters

Volumn 80, Issue 18, 2002, Pages 3430-3432

Influence of temperature and drive current on degradation mechanisms in organic light-emitting diodes

(2) Ishii, Masahiko a Taga, Yasunori a

a Rd Management Section (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CONSTANT CURRENT DENSITY; DECAY CURVES; DEGRADATION MECHANISM; DRIVE CURRENTS; HALF LIVES; RELATIVE CONTRIBUTION; TIME-SCALES;

DEGRADATION; GLASS TRANSITION; LIGHT EMISSION; ORGANIC LIGHT EMITTING DIODES (OLED);

DECAY (ORGANIC);

EID: 79956049968 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1476704 Document Type: Article

Times cited : (114)

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