Response compaction for test time and test pins reduction based on advanced convolutional codes

IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volumn , Issue , 2004, Pages 298-305

  Han, Yinhe ^b   Hu, Yu ^b   Li, Huawei ^b   Li, Xiaowei ^b   Chandra, Anshuman ^a  

^a SYNOPSYS INC   (United States)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

ENCODERS; INPUT ASSIGNMENT; MEMORY SIZE; TEST RESPONSE;

ALGORITHMS; OPTIMIZATION; SIGNAL ENCODING; THEOREM PROVING;

CODES (STANDARDS);

EID: 24944545813     PISSN: 15505774     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DFTVS.2004.1347852     Document Type: Conference Paper

References (19)

1. A. Ivanov, B. Tsuji, Y. Zorian, "Programmable Space Compactors for BIST", IEEE Transaction on Computer, No.12,pp. 1393-1405, Dec.1996.
2. K. Chakrabarty, B. T. Murray, and J. P. Hays, "Optimal zero-aliasing space compaction of test responses", IEEE Transaction on Computer, vol. 47, No. 11, pp.1171-1187, Nov. 1998.
3. B. B. Bhattacharya, A. Dmitriev, M.Goessel, "Zero-Aliasing Space Compaction of Test Responses Using a Single Periodic Output", IEEE Transaction on Computers, VOL.52, NO. 12, pp. 1646-1651, Dec. 2003.
4. K. K. Saluja and M. Karpovsky, "Testing computer hardware through data compression in space and time", in Proc. of International Test Conference, pp.83-88, 1983.
5. S. Mitra and K. S. Kim, "X-Compact: An Efficient Response Compaction Technique", IEEE Transactions on CAD&CS, 2004, 23(3):421-432.
6. st VLSI Test Symposium, pp. 107-112, 2003.
7. S. S. Lumetta, S. Mitra, "X-Codes: Error Control with Unknowable Inputs", in Proc. of the International Symposium on Information Theory, pp. 102, 2003.
8. C. Wang, S. M. Reddy, I. Pomeranz, J. Rajski, J. Tyszer, "On Compacting Test Response Data Containing Unknown Values", in Proc. of International Conference on CAD, pp. 855-862, 2003.
9. J. Rajski, J. Tyszer, C. Wang, S. M. Reddy, "Convolutional compaction of test responses", in Proc. of International Test Conference, pp. 745-754, 2003.
10. th Asian Test Symposium, pp440-445, 2003.
11. P. Wohl, L. Huisman, "Analysis and design of optimal combinational compactors", in Proc. of 21st VLSI Test Symposium, pp.101-106, 2003.
12. I. Pomeranz, I. S. Kundu, and S. M. Reddy, "On Output Response Compression in the Presence of Unknown Output Values", in Proc. of Design Automation Conference, pp. 255-258, 2002.
13. P. Wohl and J. A. Waicukauski, T. W. Williams, "Design of Compactors for Signature-Analyzers in Built-IN SELF-TEST', in Proc. of International Test Conference, pp. 54-63, 2001.
14. C. Barnhart, V. Brunkhorst, F. Distler, O. Farnsworth, A. Ferko, B. Keller, D. Scott, Koenemann, and T. Onodera, "Extending OPMISR beyond 10x scan test efficiency", IEEE Design and Test, 19(5), pp. 6573, 2002.
15. P. Elias, "Coding for Noisy Channels", in IRE International Convention Record, pt. 4, pp. 37-46, 1955.
16. J. L. Massey, D. J. Costello, and J. Justesen, "Polynomial Weights and Code Constructions", IEEE Transaction on Information Theory, No.1, pp. 101-110, 1973.
17. J. Justesen, "New Convolutional Code Constructions and a Class of Asymptotically Good Time-Varying Codes", IEEE Transaction on Information Theory, 19(2), pp. 220-225, 1973.
18. J. Rosenthal, J. M. Schumacher and E. V. York, "The behavior of Convolutional codes", in the report BSR9533 of National Research Institute for Mathematics and Computer Science in the Netherlands
19. S. Lin, D. J. Costello, "Error Control Coding: Fundamentals and Applications", Published by Prentice Hall, October 1, 1982.