Zero-Aliasing Space Compaction of Test Responses Using a Single Periodic Output

IEEE Transactions on Computers

Volumn 52, Issue 12, 2003, Pages 1646-1651

  Bhattacharya, Bhargab B ^a   Dmitriev, Alexej ^b   Gössel, Michael ^b  

^a INDIAN STATISTICAL INSTITUTE   (India)

^b UNIVERSITY OF POTSDAM   (Germany)

Author keywords

Space compaction; Stuck at faults; System on a chip; Testing

Indexed keywords

ALGORITHMS; BUILT-IN SELF TEST; CODES (SYMBOLS); DATA REDUCTION; FORMAL LOGIC; ITERATIVE METHODS; MICROPROCESSOR CHIPS; PRODUCT DESIGN;

ALIASING; SPACE COMPACTION;

COMBINATORIAL CIRCUITS;

EID: 0346119950     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/TC.2003.1252860     Document Type: Article

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