-
1
-
-
0001302785
-
-
Reynolds, D. C.; Leies, G.; Antes, L. T.; Marburger, R. E. Phys. Rev. 1954, 96, 533.
-
(1954)
Phys. Rev.
, vol.96
, pp. 533
-
-
Reynolds, D.C.1
Leies, G.2
Antes, L.T.3
Marburger, R.E.4
-
2
-
-
0037005865
-
-
(a) Reijnen, L.; Meester, B.; Goossens, A.; Schoonman, J. Mater. Sci. Eng. 2002, C19, 311.
-
(2002)
Mater. Sci. Eng.
, vol.C19
, pp. 311
-
-
Reijnen, L.1
Meester, B.2
Goossens, A.3
Schoonman, J.4
-
3
-
-
0037425099
-
-
(b) Liu, G.; Schulmeyer, T.; Thissen, A.; Klein, A.; Jaegermann, W. Appl. Phys. Lett. 2003, 82, 2269.
-
(2003)
Appl. Phys. Lett.
, vol.82
, pp. 2269
-
-
Liu, G.1
Schulmeyer, T.2
Thissen, A.3
Klein, A.4
Jaegermann, W.5
-
4
-
-
0141980891
-
-
(c) Reijnen, L.; Meester, B.; Goosens, A.; Schoonman, J. Chem. Vap. Deposition 2003, 9, 15.
-
(2003)
Chem. Vap. Deposition
, vol.9
, pp. 15
-
-
Reijnen, L.1
Meester, B.2
Goosens, A.3
Schoonman, J.4
-
6
-
-
0042807626
-
-
(b) Berhanu, D.; Boyle D. S.; Govender, K.; O'Brien, P. J. Mater. Sci.: Mater. Electron. 2003, 14, 579.
-
(2003)
J. Mater. Sci.: Mater. Electron.
, vol.14
, pp. 579
-
-
Berhanu, D.1
Boyle, D.S.2
Govender, K.3
O'Brien, P.4
-
7
-
-
0003666902
-
-
Subramanian, P. R., Chakrabarti, D. J., Laughlin, D. E., Eds.; ASM: Materials Park
-
2S, indicating the low-temperature phase of the chalcocite polymorphs: Chakrabarti, D. J.; Laughlin, D. E. In Phase Diagrams of Binary Copper Alloys; Subramanian, P. R., Chakrabarti, D. J., Laughlin, D. E., Eds.; ASM: Materials Park, 1994.
-
(1994)
Phase Diagrams of Binary Copper Alloys
-
-
Chakrabarti, D.J.1
Laughlin, D.E.2
-
8
-
-
0032179296
-
-
Nair, M. T. S.; Guerrero, L.; Nair, P. K. Semicond. Sci. Technol. 1998, 13, 1164.
-
(1998)
Semicond. Sci. Technol.
, vol.13
, pp. 1164
-
-
Nair, M.T.S.1
Guerrero, L.2
Nair, P.K.3
-
9
-
-
0018442990
-
-
(a) Armantrout, G. A.; Miller, D. E.; Vindelov, K. E.; Brown, T. G.; J. Vac. Sci. 1979, 16, 212.
-
(1979)
J. Vac. Sci.
, vol.16
, pp. 212
-
-
Armantrout, G.A.1
Miller, D.E.2
Vindelov, K.E.3
Brown, T.G.4
-
11
-
-
0035676086
-
-
(c) He, Y. B.; Polity, A.; Österreicher, I.; Pfisterer, D.; Gregor, R.; Meyer, B. K.; Hardt, M. Physica B 2001, 308-310, 1069.
-
(2001)
Physica B
, vol.308-310
, pp. 1069
-
-
He, Y.B.1
Polity, A.2
Österreicher, I.3
Pfisterer, D.4
Gregor, R.5
Meyer, B.K.6
Hardt, M.7
-
13
-
-
19944366601
-
-
Reijnen, L.; Meester, B.; de Lange, F.; Schoonman, J.; Goossens, A. Chem. Mater. 2005, 17, 2724.
-
(2005)
Chem. Mater.
, vol.17
, pp. 2724
-
-
Reijnen, L.1
Meester, B.2
De Lange, F.3
Schoonman, J.4
Goossens, A.5
-
21
-
-
0030232241
-
-
(a) Nomura, R.; Miyawaki, Toyosaki, T.; Matsuda, H. Chem. Vap. Deposition 1996, 2, 174.
-
(1996)
Chem. Vap. Deposition
, vol.2
, pp. 174
-
-
Nomura, R.1
Miyawaki Toyosaki, T.2
Matsuda, H.3
-
22
-
-
0000683124
-
-
(b) Fainer, N. I.; Rumyantsev, Y. M.; Kosinova, M. L.; Yurev, G. S.; Maksimovskii, E. A.; Zemskova, S. M.; Sysoev, S. V.; Kuznetsov, F. A. Inorg. Mater. 1998, 34, 1049.
-
(1998)
Inorg. Mater.
, vol.34
, pp. 1049
-
-
Fainer, N.I.1
Rumyantsev, Y.M.2
Kosinova, M.L.3
Yurev, G.S.4
Maksimovskii, E.A.5
Zemskova, S.M.6
Sysoev, S.V.7
Kuznetsov, F.A.8
-
23
-
-
0036755377
-
-
(c) Kemmler, M.; Lazell, M.; O'Brien, P.; Otway, D. J.; Park, J.-H.; Walsh, J. R. J. Mater. Sci. Mater. Electron. 2002, 13, 531
-
(2002)
J. Mater. Sci. Mater. Electron.
, vol.13
, pp. 531
-
-
Kemmler, M.1
Lazell, M.2
O'Brien, P.3
Otway, D.J.4
Park, J.-H.5
Walsh, J.R.6
-
24
-
-
22944443578
-
-
(c) McCain, M. N.; Metz, A. W.; Yang, Y.; Stern, C. L.; Marks, T. J. Chem. Vap. Deposition 2005, 11, 291.
-
(2005)
Chem. Vap. Deposition
, vol.11
, pp. 291
-
-
McCain, M.N.1
Metz, A.W.2
Yang, Y.3
Stern, C.L.4
Marks, T.J.5
-
25
-
-
0038634972
-
-
(a) Larsen, T. H.; Sigman, M.; Ghezelbash, A.; Doty, R. C.; Korgel, B. A. J. Am. Chem. Soc. 2003, 125, 5638.
-
(2003)
J. Am. Chem. Soc.
, vol.125
, pp. 5638
-
-
Larsen, T.H.1
Sigman, M.2
Ghezelbash, A.3
Doty, R.C.4
Korgel, B.A.5
-
26
-
-
0346994906
-
-
(b) Sigman, M. B., Jr.; Ghezelbash, A.; Hanrath T.; Saunders, A. E.; Lee, F.; Korgel, B. A. J. Am. Chem. Soc. 2003, 125, 16050.
-
(2003)
J. Am. Chem. Soc.
, vol.125
, pp. 16050
-
-
Sigman Jr., M.B.1
Ghezelbash, A.2
Hanrath, T.3
Saunders, A.E.4
Lee, F.5
Korgel, B.A.6
-
27
-
-
11444256581
-
-
(c) Chen, L.; Chen, Y.-B.; Wu, L.-M. J. Am. Chem. Soc. 2004, 126, 16334.
-
(2004)
J. Am. Chem. Soc.
, vol.126
, pp. 16334
-
-
Chen, L.1
Chen, Y.-B.2
Wu, L.-M.3
-
28
-
-
12044258861
-
-
(a) Hirpo, W.; Dhingra, S.; Sutorik, A. C.; Kanatzidis, M. G. J. Am. Chem. Soc. 1993, 115, 1597.
-
(1993)
J. Am. Chem. Soc.
, vol.115
, pp. 1597
-
-
Hirpo, W.1
Dhingra, S.2
Sutorik, A.C.3
Kanatzidis, M.G.4
-
29
-
-
0000001240
-
-
(b) Hollingsworth, J. A.; Hepp, A. F.; Buhro, W. E. Chem. Vap. Deposition 1999, 5, 105.
-
(1999)
Chem. Vap. Deposition
, vol.5
, pp. 105
-
-
Hollingsworth, J.A.1
Hepp, A.F.2
Buhro, W.E.3
-
30
-
-
0035189498
-
-
(c) Banger, K. K.; Cowen, J.; Hepp, A. F. Chem. Mater. 2001, 13, 3827.
-
(2001)
Chem. Mater.
, vol.13
, pp. 3827
-
-
Banger, K.K.1
Cowen, J.2
Hepp, A.F.3
-
31
-
-
0036468037
-
-
(d) Banger, K. K.; Harris, J. D.; Cowen, J. E.; Hepp, A. F. Thin Solid Films 2002, 403-404, 390.
-
(2002)
Thin Solid Films
, vol.403-404
, pp. 390
-
-
Banger, K.K.1
Harris, J.D.2
Cowen, J.E.3
Hepp, A.F.4
-
32
-
-
0038018583
-
-
(e) Hollingsworth, J. A.; Banger, K. K.; Jin, M. H.-C.; Harris, J. D.; Cowen, J. E.; Bohannan, E. W.; Switzer, J. A.; Buhro, W. E.; Hepp, A. F. Thin Solid Films 2003, 431-432, 63.
-
(2003)
Thin Solid Films
, vol.431-432
, pp. 63
-
-
Hollingsworth, J.A.1
Banger, K.K.2
Jin, M.H.-C.3
Harris, J.D.4
Cowen, J.E.5
Bohannan, E.W.6
Switzer, J.A.7
Buhro, W.E.8
Hepp, A.F.9
-
33
-
-
0043027010
-
-
(f) Castro, S. L.; Bailey, S. G.; Raffaelle, R. P.; Banger, K. K.; Hepp, A. F. Chem. Mater. 2003, 15, 3142.
-
(2003)
Chem. Mater.
, vol.15
, pp. 3142
-
-
Castro, S.L.1
Bailey, S.G.2
Raffaelle, R.P.3
Banger, K.K.4
Hepp, A.F.5
-
34
-
-
24944539093
-
-
U.S. Patent 3,206,466
-
Reifenschneider, W. U.S. Patent 3,206,466, 1965.
-
(1965)
-
-
Reifenschneider, W.1
-
35
-
-
24944437458
-
-
Janssen, M. D.; Grove, D. M.; van Koten, G. Prog. Inorg. Chem. 1997, 46, 997.
-
(1997)
Prog. Inorg. Chem.
, vol.46
, pp. 997
-
-
Janssen, M.D.1
Grove, D.M.2
Van Koten, G.3
-
36
-
-
24944579435
-
-
note
-
TGA analyses were carried out with 10-25 mg of the samples in alumina pans at heating rates of 3°C/min. N: flow rates at atmospheric pressure were adjusted to 100 mL/min.
-
-
-
-
37
-
-
0000525313
-
-
Dance, I. G.; Guerney, P. J.; Rae, A. D.; Scudder, M. L. Inorg. Chem. 1983, 22, 2883.
-
(1983)
Inorg. Chem.
, vol.22
, pp. 2883
-
-
Dance, I.G.1
Guerney, P.J.2
Rae, A.D.3
Scudder, M.L.4
-
39
-
-
24944463075
-
-
note
-
2n] could not be unambiguously assigned.
-
-
-
-
43
-
-
24944444599
-
-
note
-
2S transforms to the h00 orientation in the djurleite superstructure.
-
-
-
-
44
-
-
84947832683
-
-
Frost, D. C.; Ishitani, A.; McDowell, C. A. Mol. Phys. 1972, 24, 861.
-
(1972)
Mol. Phys.
, vol.24
, pp. 861
-
-
Frost, D.C.1
Ishitani, A.2
McDowell, C.A.3
-
45
-
-
0019610781
-
-
Bhide, V. G.; Salkalachen, S.; Rastogi, A. C.; Rao, C. N. R.; Hedge, M. S. J. Phys. D: Appl. Phys. 1981, 14, 1647.
-
(1981)
J. Phys. D: Appl. Phys.
, vol.14
, pp. 1647
-
-
Bhide, V.G.1
Salkalachen, S.2
Rastogi, A.C.3
Rao, C.N.R.4
Hedge, M.S.5
|