Studies of iron and iron oxide layers by electron spectroscopes

Applied Surface Science

Volumn 252, Issue 2, 2005, Pages 330-338

  Lesiak, B ^a   Jablonski, A ^a   Zemek, J ^b   Jiricek, P ^b   Cernansky M ^b  

^a INSTITUTE OF PHYSICAL CHEMISTRY   (Poland)

^b INSTITUTE OF PHYSICS   (Czech Republic)

Author keywords

Cu standard; Elastic peak electron spectroscopy (EPES); Fe 2.2 O 3; Fe 2 O 3; Inelastic mean free path (IMFP); Iron; Iron oxide layers; Layer thickness; Surface excitation; X ray photoelectron spectroscopy (XPS)

Indexed keywords

BINDING ENERGY; ELECTRON SPECTROSCOPY; IRON OXIDES; SPECTROMETERS; X RAY PHOTOELECTRON SPECTROSCOPY;

CU STANDARD; ELASTIC PEAK ELECTRON SPECTROSCOPY (EPES); ELECTRON SPECTROSCOPES; FE 2.2 O 3; FE 2 O 3; INELASTIC MEAN FREE PATH (IMFP); IRON OXIDE LAYERS; LAYER THICKNESS; SURFACE EXCITATION;

IRON;

EID: 24644457701     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.12.055     Document Type: Article

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