SCOPUS 정보 검색 플랫폼

Volumn 357-358, Issue , 1996, Pages 180-185

Extraction of depth distributions of electron-excited Auger electrons in Fe, Ni and Si using inelastic peak shape analysis

(3) Fujita, D a Schleberger, M b Tougaard, S b

a NATIONAL INSTITUTE FOR MATERIALS SCIENCE (Japan)

b UNIVERSITY OF SOUTHERN DENMARK (Denmark)

Author keywords

Auger electron spectroscopy; Inelastic mean free path; Iron; Nickel; Quantitative surface analysis; Reflection electron energy loss spectroscopy; Silicon; X ray photoelectron spectroscopy

Indexed keywords

ELECTRON ENERGY LEVELS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; ELECTRON TRANSPORT PROPERTIES; IRON; NICKEL; POLYCRYSTALLINE MATERIALS; PROBABILITY DENSITY FUNCTION; SILICON; X RAY PHOTOELECTRON SPECTROSCOPY;

AUGER ELECTRONS; EXTRACTION OF DEPTH DISTRIBUTION OF ELECTRON; INELASTIC MEAN FREE PATH; INELASTIC SCATTERING; QUANTITATIVE SURFACE ANALYSIS;

AUGER ELECTRON SPECTROSCOPY;

EID: 13544251916 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/0039-6028(96)00085-4 Document Type: Article

Times cited : (15)

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