Inelastic mean free path measurements of electrons near nickel surfaces

Surface and Interface Analysis

Volumn 30, Issue 1, 2000, Pages 217-221

  Lesiak, B ^a   Jablonski, A ^a   Zemek, J ^b   Jiricek, P ^b   Lejcek, P ^b   Cernansky M ^b  

^a INSTITUTE OF PHYSICAL CHEMISTRY   (Poland)

^b INSTITUTE OF PHYSICS   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; GRAIN SIZE AND SHAPE; MORPHOLOGY; NICKEL; PROBABILITY; STATISTICAL METHODS; SURFACE STRUCTURE; TEXTURES;

INELASTIC MEAN FREE PATH (IMFP); UNCERTAINTY ANALYSIS;

METAL FOIL;

EID: 0034245316     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/1096-9918(200008)30:1<217::AID-SIA775>3.0.CO;2-4     Document Type: Article

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