Strain and composition profiles of self-assembled Ge/Si (001) islands

Journal of Applied Physics

Volumn 98, Issue 3, 2005, Pages

  Alonso, M I ^a   De La Calle, M ^a   Osso J O ^a   Garriga, M ^a   Goni A R ^a  

^a UNIVERSITAT AUTÒNOMA DE BARCELONA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EPILAYERS; SPECTROSCOPIC ELLIPSOMETRY; SUPERDOMES; WET CHEMICAL ETCHING;

ATOMIC FORCE MICROSCOPY; COMPOSITION; DIFFUSION; ELLIPSOMETRY; EPITAXIAL GROWTH; HYDROGEN PEROXIDE; MORPHOLOGY; RAMAN SPECTROSCOPY; SELF ASSEMBLY;

SEMICONDUCTING GERMANIUM COMPOUNDS;

EID: 23944469380     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2006229     Document Type: Article

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