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Physical Review Letters

Volumn 64, Issue 3, 1990, Pages 315-318

Spectroscopic ellipsometry of E1-like transitions in nanometer-thickness Ge layers

(4) Freeouf, J L a Tsang, J C a Legoues, F K a Iyer, S S a

a IBM T J WATSON RESEARCH CENTER (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000896318 PISSN: 00319007 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevLett.64.315 Document Type: Article

Times cited : (26)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.