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Volumn 237-239, Issue 1-4 III, 2002, Pages 1685-1691

Silicon defect and impurity studies using float-zone crystal growth as a tool

Author keywords

A1. Defects; A1. Impurities; A1. Point defects; A2. Floating zone technique; B2. Semiconducting silicon

Indexed keywords

CHARGE CARRIERS; CRYSTAL IMPURITIES; DISLOCATIONS (CRYSTALS); GRAIN SIZE AND SHAPE; PHOTOCONDUCTIVITY; PHOTOVOLTAIC EFFECTS; POINT DEFECTS; SEMICONDUCTING SILICON; SEMICONDUCTOR DOPING; SOLAR CELL ARRAYS;

EID: 0036530998     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(01)02325-9     Document Type: Article
Times cited : (23)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.