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Volumn 237-239, Issue 1-4 III, 2002, Pages 1685-1691
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Silicon defect and impurity studies using float-zone crystal growth as a tool
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Author keywords
A1. Defects; A1. Impurities; A1. Point defects; A2. Floating zone technique; B2. Semiconducting silicon
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Indexed keywords
CHARGE CARRIERS;
CRYSTAL IMPURITIES;
DISLOCATIONS (CRYSTALS);
GRAIN SIZE AND SHAPE;
PHOTOCONDUCTIVITY;
PHOTOVOLTAIC EFFECTS;
POINT DEFECTS;
SEMICONDUCTING SILICON;
SEMICONDUCTOR DOPING;
SOLAR CELL ARRAYS;
FLOAT ZONE CRYSTAL GROWTH;
CRYSTAL GROWTH FROM MELT;
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EID: 0036530998
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(01)02325-9 Document Type: Article |
Times cited : (23)
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References (14)
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