메뉴 건너뛰기




Volumn 17, Issue 4, 1999, Pages 1485-1501

Evolution of microstructure and dislocation dynamics in InxGa1-xP graded buffers grown on GaP by metalorganic vapor phase epitaxy: Engineering device-quality substrate materials

Author keywords

[No Author keywords available]

Indexed keywords


EID: 22644451896     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (52)

References (38)
  • 15
    • 24644446558 scopus 로고    scopus 로고
    • Ph.D. thesis, MIT
    • M. T. Bulsara, Ph.D. thesis, MIT (1998).
    • (1998)
    • Bulsara, M.T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.